Method SetGlobalPinSiteData
- Assembly
- NationalInstruments.SemiconductorTestLibrary.Abstractions.dll
SetGlobalPinSiteData<T>(ISemiconductorModuleContext, string, PinSiteData<T>, bool)
Associates a data item with a dataId. Use this method to store a PinSiteData object you initialize in one location and access later in a downstream location using the GetGlobalPinSiteData<T>(ISemiconductorModuleContext, string, bool) method.
public static void SetGlobalPinSiteData<T>(this ISemiconductorModuleContext tsmContext, string dataId, PinSiteData<T> pinSiteData, bool overrideIfExisting = true)
Parameters
tsmContextISemiconductorModuleContextThe NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.ISemiconductorModuleContext object.
dataIdstringA unique ID to distinguish the data.
pinSiteDataPinSiteData<T>A data item to store and later retrieve using the specified dataId. If the data item is null, the method deletes the data with the specified dataId if it exists.
overrideIfExistingboolSpecifies whether to override the existing data for a specific pin-site pair with that in the given PinSiteData object.
Type Parameters
TData type of value to use with PinSiteData<T> object.
Exceptions
- NISemiconductorTestException
Thrown when data for a specific pin-site pair already exists but
overrideIfExistingis set to false.