Method SetGlobalPinSiteData<T>

Namespace

NationalInstruments.SemiconductorTestLibrary.DataAbstraction

Assembly

NationalInstruments.SemiconductorTestLibrary.Abstractions.dll

SetGlobalPinSiteData<T>(ISemiconductorModuleContext, string, PinSiteData<T>, bool)

Associates a data item with a dataId. Use this method to store a PinSiteData object you initialize in one location and access later in a downstream location using the NationalInstruments.SemiconductorTestLibrary.DataAbstraction.TSMContextExtensions.GetGlobalPinSiteData``1(NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.ISemiconductorModuleContext,System.String,System.Boolean) method.

public static void SetGlobalPinSiteData<T>(this ISemiconductorModuleContext tsmContext, string dataId, PinSiteData<T> pinSiteData, bool overrideIfExisting = true)

Parameters

tsmContext ISemiconductorModuleContext

The NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.ISemiconductorModuleContext object.

dataId string

A unique ID to distinguish the data.

pinSiteData PinSiteData<T>

A data item to store and later retrieve using the specified dataId. If the data item is null, the method deletes the data with the specified dataId if it exists.

overrideIfExisting bool

Specifies whether to override the existing data for a specific pin-site pair with that in the given PinSiteData object.

Type Parameters

T

Data type of value to use with NationalInstruments.SemiconductorTestLibrary.DataAbstraction.PinSiteData`1 object.

Exceptions

NISemiconductorTestException

Thrown when data for a specific pin-site pair already exists but overrideIfExisting is set to false.