Method GetGlobalPinSiteData

Namespace: NationalInstruments.SemiconductorTestLibrary.DataAbstraction

Assembly: NationalInstruments.SemiconductorTestLibrary.Abstractions.dll

GetGlobalPinSiteData<T>(ISemiconductorModuleContext, string, bool)

Gets a PinSiteData object previously stored by the SetGlobalPinSiteData<T>(ISemiconductorModuleContext, string, PinSiteData<T>) method. The global data item is filtered for sites in NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.ISemiconductorModuleContext before return when filterForActiveSites is set to true.

public static PinSiteData<T> GetGlobalPinSiteData<T>(this ISemiconductorModuleContext tsmContext, string dataId, bool filterForActiveSites = true)

Parameters

tsmContext ISemiconductorModuleContext: The NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.ISemiconductorModuleContext object.
dataId string: A unique ID to distinguish the data. This parameter must match a value you specify in a call to the SetGlobalPinSiteData method.
filterForActiveSites bool: Determines whether to filter the global data item for sites in NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.ISemiconductorModuleContext.

Returns

PinSiteData<T>: The global PinSiteData item that is previously stored.

Type Parameters

T: Data type of value to use with PinSiteData<T> object.

Exceptions