Table of Contents

Method PerInstrumentPerChannelResultsToPerSitePerPinResults<T>

Namespace
NationalInstruments.SemiconductorTestLibrary.Common
Assembly
NationalInstruments.SemiconductorTestLibrary.Abstractions.dll

PerInstrumentPerChannelResultsToPerSitePerPinResults<T>(IEnumerable<ISessionInformation>, T[][], SitePinResultsFilling<T>)

Converts per-instrument per-channel results to per-site per-pin results.

public static IDictionary<int, IDictionary<string, T>> PerInstrumentPerChannelResultsToPerSitePerPinResults<T>(this IEnumerable<ISessionInformation> allSessionInfo, T[][] perInstrumentPerChannelResults, ParallelExecution.SitePinResultsFilling<T> customSitePinResultsFilling = null)

Parameters

allSessionInfo IEnumerable<ISessionInformation>

An enumerable of session info.

perInstrumentPerChannelResults T[][]

The per-instrument per-channel results to convert.

customSitePinResultsFilling ParallelExecution.SitePinResultsFilling<T>

The custom logic for filling site pin results dictionary.

Returns

IDictionary<int, IDictionary<string, T>>

The converted per-site per-pin results.

Type Parameters

T

The type of the per-instrument per-channel result.