Namespace NationalInstruments.SemiconductorTestLibrary.Common
Classes
- CascadingInfo
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Defines an object that contains the cascading information for an individual pin per site.
- ExceptionCollector
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Collects and manages exceptions that occur during operations, allowing them to be aggregated and thrown as a single NationalInstruments.SemiconductorTestLibrary.Common.NISemiconductorTestException.
- GangingInfo
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Defines an object that contains the ganging information for an individual pin for each site.
- HelperMethods
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Provides helper methods.
- NISemiconductorTestException
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Defines a specific exception for NI Semiconductor Test Library.
- ParallelExecution
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Defines utility methods for handling parallel execution.
- Publish
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Defines measurement results publish methods.
- SitePinInfo
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Defines an object that contains the information for an individual site-pin pair. Such as, the site number, pin name, instrument channel string used by the driver, instrument model, etc.
- SystemSettings
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Defines system settings.
- Utilities
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Provides general helper methods.
Enums
- MeasurementType
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Defines whether to measure voltage or current.
Delegates
- ParallelExecution.PinSiteResultsFilling<T>
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Represents a method that processes a NationalInstruments.SemiconductorTestLibrary.Common.SitePinInfo and updates a shared results dictionary.
- ParallelExecution.PinSiteResultsFilling<T>
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Represents a method that processes a NationalInstruments.SemiconductorTestLibrary.Common.SitePinInfo and updates a shared results dictionary.
- ParallelExecution.SitePinResultsFilling<T>
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Represents a method that processes a NationalInstruments.SemiconductorTestLibrary.Common.SitePinInfo and updates a shared results dictionary.
- ParallelExecution.SitePinResultsFilling<T>
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Represents a method that processes a NationalInstruments.SemiconductorTestLibrary.Common.SitePinInfo and updates a shared results dictionary.