Table of Contents

Namespace NationalInstruments.SemiconductorTestLibrary.Common

Classes

ExceptionCollector

Collects and manages exceptions that occur during operations, allowing them to be aggregated and thrown as a single NISemiconductorTestException.

NISemiconductorTestException

Defines a specific exception for NI Semiconductor Test Library.

ParallelExecution

Defines utility methods for handling parallel execution.

Publish

Defines measurement results publish methods.

SitePinInfo

Defines an object that contains the information for an individual site-pin pair. Such as, the site number, pin name, instrument channel string used by the driver, instrument model, etc.

SystemSettings

Defines system settings.

Utilities

Provides general helper methods.

Enums

MeasurementType

Defines whether to measure voltage or current.