Sharing SiteData and PinSiteData Between Code Modules

You can store site and pin data within the SemiconductorModuleContext in one code module, and retrieve it later in another code module within the same test program using an ID string. For more information, refer to Sharing Data between Code Modules (TSM) topic in the TSM documentation.

Note

The SetSiteData and GetSiteData methods provided by the TSM Code Module API do not support SiteData or PinSiteData objects directly.

Use the following methods from the Semiconductor Test Library to share SiteData and PinSiteData objects between code modules:

• SetGlobalSiteData
• GetGlobalSiteData
• SetGlobalPinSiteData
• GetGlobalPinSiteData

SetGlobalSiteData and SetGlobalPinSiteData behavior

The SetGlobalSiteData and SetGlobalPinSiteData methods override the existing data by default. This occurs when data for a specific site already exists in the SiteData object that is associated with a given ID string, or data that is associated with a given ID string for a specific pin-site pair already exists in the PinSiteData object. To preserve existing data, pass false to the overrideIfExisting input parameter.

Note

An NISemiconductorTestException is thrown when data already exists and overrideIfExisting is set to false.

GetGlobalSiteData and GetGlobalPinSiteData behavior

The GetGlobalSiteData and GetGlobalPinSiteData methods filter for active sites in SemiconductorModuleContext by default. To retrieve the exact data you store with the SetGlobalSiteData and SetGlobalPinSiteData methods, pass false to the filterForActiveSites input parameter.

Note

An NISemiconductorTestException is thrown when data has not been set for one or more active sites, and filterForActiveSites input parameter is set to true (default). To retrieve the exact data stored with the SetGlobalSiteData and SetGlobalPinSiteData methods regardless of the active sites, pass false to the filterForActiveSites input parameter.

Sharing SiteData

The following example shows how to store per-site measurement data for comparison in a later test step::

public static void FirstCodeModule(
	ISemiconductorModuleContext semiconductorModuleContext,
	string pinName,
	string patternName,
	string waveformName,
	int samplesToRead)
{
    TSMSessionManager sessionManager = new TSMSessionManager(semiconductorModuleContext);
    DigitalSessionsBundle digitalPin = sessionManager.Digital(pinName);
    digitalPin.BurstPattern(patternName);
    SiteData<uint[]> measurement = digitalPin.FetchCaptureWaveform(waveformName, samplesToRead);

    semiconductorModuleContext.SetGlobalSiteData("ComparisonData", measurement);
}

public static void SecondCodeModule(
    ISemiconductorModuleContext semiconductorModuleContext,
    string pinName,
    string patternName,
    string waveformName,
    int samplesToRead)
{
    SiteData<uint[]> comparisonData = semiconductorModuleContext.GetGlobalSiteData<uint[]>("ComparisonData");

    TSMSessionManager sessionManager = new TSMSessionManager(semiconductorModuleContext);
    DigitalSessionsBundle digitalPin = sessionManager.Digital(pinName);
    digitalPin.BurstPattern(patternName);
    SiteData<uint[]> measurement = digitalPin.FetchCaptureWaveform(waveformName, samplesToRead);

    SiteData<bool[]> comparisonResults = measurement.Compare<uint[], bool[]>(ComparisonType.EqualTo, comparisonData);
    // Publish the Aggregate Comparison Result: whether or not all samples in the comparison result are found to be True.
    SiteData<bool> aggregateComparisonResult = comparisonResults.Select(result => result.All(value => value));
    semiconductorModuleContext.PublishResults(aggregateComparisonResult, "ComparisonResults");
}

Sharing PinSiteData

The following example shows how to store per-site per-pin measurement data for comparison in a later test step:

public static void FirstCodeModule(ISemiconductorModuleContext semiconductorModuleContext, string pinName)
{
    TSMSessionManager sessionManager = new TSMSessionManager(semiconductorModuleContext);
    DCPowerSessionsBundle dcPowerPin = sessionManager.DCPower(pinName);
    PinSiteData<double> measurement = dcPowerPin.MeasureVoltage();

    semiconductorModuleContext.SetGlobalPinSiteData("ComparisonData", measurement);
}

public static void SecondCodeModule(ISemiconductorModuleContext semiconductorModuleContext, string pinName)
{
    PinSiteData<double> comparisonData = semiconductorModuleContext.GetGlobalPinSiteData<double>("ComparisonData");

    TSMSessionManager sessionManager = new TSMSessionManager(semiconductorModuleContext);
    DCPowerSessionsBundle dcPowerPin = sessionManager.DCPower(pinName);
    PinSiteData<double> measurement = dcPowerPin.MeasureVoltage();

    PinSiteData<double> comparisonResults = measurement.Subtract(comparisonData);
    semiconductorModuleContext.PublishResults(comparisonResults, "ComparisonResults");
}