Parallelization Methods

The Semiconductor Test Library provides extension methods for abstracting parallel for loops that are required to iterate over each of the various instrument sessions within a given pin sessions bundle.

• Note that you can use the Parallelization methods with any class that inherits from the ISessionsBundle interface, such as the DCPowerSessionsBundle class.
• You can use these methods to perform one or more driver operations across each instrument session associated with the pin(s) queried.
• Overloads allow you to specify whether an operation is to be performed across each session or across each pin and site.
• You should use these methods only when writing low-level driver calls to implement instrument capabilities not yet exposed by the Semiconductor Test Library.

Note

Class: ParallelExecution
Namespace: NationalInstruments.SemiconductorTestLibrary.Common
Assembly: NationalInstruments.SemiconductorTestLibrary.Abstractions.dll

Related Concepts:

• Making Low-Level Driver Calls
• NI TSM: Parallel For Loops