Supported Instrument Types
The Semiconductor Test Library supports the core set of modular instruments commonly used within the NI Semiconductor Test System (STS). Refer to the following table for the instrument types currently supported by the library.
Table 1: Supported Instrument Types
| Instrument Type | Driver | Abstractions | Extensions |
|---|---|---|---|
| NI Source Measurement Unit (SMU) | niDCPower | Supported | Core Support |
| NI Programmable Power Supply (PPS) | niDCPower | Supported | Core Support |
| NI Multifunction I/O (DAQ) * | niDAQmx | Supported | Limited Support + |
| NI Sound and Vibration Module (DSA) * * | niDAQmx | Supported | Limited Support ++ |
| NI Digital Pattern Instrument (DPI/HSD) | niDigital | Supported | Core Support |
| NI Digital Multimeter (DMM) | niDmm | Supported | Core Support |
| NI Relay Module (RELAY) | niSwitch | Supported | Core Support |
| NI Function Generator (FGEN) | niFgen | Supported | Not Yet Supported |
| NI Digitizer/Oscilloscope (SCOPE) | niScope | Supported | Not Yet Supported |
| NI Timing Synchronization Module (SYNC) | niSync | Supported | Not Yet Supported |
Note
Core Support: Only the core functionality to use the instrument is supported, and some advanced features are not yet exposed with a high-level Extension method. Refer to the documentation to learn how to interact with the lower-level driver APIs using the provided Abstraction methods.
Limited Support: Only the most common use cases are implemented.
* Only PXIe-6368 devices are currently supported.
* * Only PXIe-4467/8 devices are currently supported.
+ Only Analog Input, Analog Output, Digital Input, and Digital Output task types are currently supported.
++ Only Analog Input, Analog Output, and Analog Output: Function Generation task types are supported.