Method GetFailCount

Namespace

NationalInstruments.SemiconductorTestLibrary.InstrumentAbstraction.Digital

Assembly

NationalInstruments.SemiconductorTestLibrary.Extensions.dll

GetFailCount(DigitalSessionsBundle)

Gets fail count on a per-pin per-site basis of last burst pattern (long).

public static PinSiteData<long> GetFailCount(this DigitalSessionsBundle sessionsBundle)

Parameters

sessionsBundle DigitalSessionsBundle

The DigitalSessionsBundle object.

Returns

PinSiteData<long>

The per-site per-pin fail count.