Method MeasureTDROffsets

Namespace

NationalInstruments.SemiconductorTestLibrary.InstrumentAbstraction.Digital

Assembly

NationalInstruments.SemiconductorTestLibrary.Extensions.dll

MeasureTDROffsets(DigitalSessionsBundle, bool)

Measures propagation delays through cables, connectors, and load boards using Time-Domain Reflectometry (TDR). You can optionally apply the offsets to the pins. Use this method to measure per-site per-pin offsets.

public static PinSiteData<PrecisionTimeSpan> MeasureTDROffsets(this DigitalSessionsBundle sessionsBundle, bool apply = false)

Parameters

sessionsBundle DigitalSessionsBundle

The DigitalSessionsBundle object.

apply bool

Whether to apply the offsets to the pins.

Returns

PinSiteData<PrecisionTimeSpan>

MeasureTDROffsets(DigitalSessionsBundle, out PrecisionTimeSpan[][], bool)

Measures propagation delays through cables, connectors, and load boards using Time-Domain Reflectometry (TDR). You can optionally apply the offsets to the pins. Use this method to measure per-instrument session per-pin offsets.

public static void MeasureTDROffsets(this DigitalSessionsBundle sessionsBundle, out PrecisionTimeSpan[][] offsets, bool apply = false)

Parameters

sessionsBundle DigitalSessionsBundle

The DigitalSessionsBundle object.

offsets PrecisionTimeSpan[][]

The measured TDR offsets. Where the first dimension represents instrument sessions, and the second dimension represents pins.

apply bool

Whether to apply the offsets to the pins.