Method ApplyTDROffsets

Namespace

NationalInstruments.SemiconductorTestLibrary.InstrumentAbstraction.Digital

Assembly

NationalInstruments.SemiconductorTestLibrary.Extensions.dll

ApplyTDROffsets(DigitalSessionsBundle, PinSiteData<PrecisionTimeSpan>)

Applies the correction for propagation delay offsets to a digital pattern instrument. Use this method to apply per-site per-pin offsets.

public static void ApplyTDROffsets(this DigitalSessionsBundle sessionsBundle, PinSiteData<PrecisionTimeSpan> offsets)

Parameters

sessionsBundle DigitalSessionsBundle

The NationalInstruments.SemiconductorTestLibrary.InstrumentAbstraction.Digital.DigitalSessionsBundle object.

offsets PinSiteData<PrecisionTimeSpan>

The per-site per-pin offsets to apply.

ApplyTDROffsets(DigitalSessionsBundle, PrecisionTimeSpan[][])

Applies the correction for propagation delay offsets to a digital pattern instrument. Use this method to apply offsets for each instrument session for each channel.

public static void ApplyTDROffsets(this DigitalSessionsBundle sessionsBundle, PrecisionTimeSpan[][] offsets)

Parameters

sessionsBundle DigitalSessionsBundle

The NationalInstruments.SemiconductorTestLibrary.InstrumentAbstraction.Digital.DigitalSessionsBundle object.

offsets PrecisionTimeSpan[][]

Offsets to apply. The first dimension represents instrument sessions. The second dimension represents channels.

Remarks

For each instrument session, this method supports one of the following:

• Offsets only for primary and non-shared channels
• Offsets for all site-pin channels, including shadows of shared channels

If offsets are supplied for all site-pin channels, all channels mapped to the same shared channel must have identical offset values.

Exceptions

NISemiconductorTestException

This exception is thrown if the number of instrument sessions in offsets does not match the bundle, if per-session channel counts are invalid, or if shared-channel offsets are inconsistent.