Method Fetch
- Assembly
- NationalInstruments.SemiconductorTestLibrary.Extensions.dll
Fetch(DMMSessionsBundle, double)
Fetches the values from previously initiated measurements.
public static PinSiteData<double> Fetch(this DMMSessionsBundle sessionsBundle, double maximumTimeInMilliseconds)Parameters
sessionsBundleDMMSessionsBundle-
The NationalInstruments.SemiconductorTestLibrary.InstrumentAbstraction.DMM.DMMSessionsBundle object.
maximumTimeInMillisecondsdouble-
The maximum time for the fetch to complete in milliseconds.
Returns
- PinSiteData<double>
-
The measurement results in per-site per-pin format.