Method LeakageTest

Namespace

NationalInstruments.SemiconductorTestLibrary.TestStandSteps

Assembly

NationalInstruments.SemiconductorTestLibrary.TestStandSteps.dll

LeakageTest(ISemiconductorModuleContext, string[], double, double, double, double, bool)

Performs a single leakage measurement using the following test method:

1. The test first configures the instruments connected to the specified pins and ensures they are forcing 0V.
2. The specified voltage is then forced on each pin.
3. After the specified settling time, the current is measured on each pin.
4. Each pin is then configured back to forcing 0V.
5. Finally, the output on each pin is disabled. Pins mapped to either an NI SMU or NI PPMU(s) instrument channel are supported. By default, steps 2-4 are preformed in parallel, across all pins simultaneously. When the serialOperationEnabled Boolean input parameter is set to true, steps 2-4 are preformed serially, for each pin or pin group, one at a time. Pins within pin groups are always operated on in parallel. The following Published Data Id is used for test results on a per-pin basis: Leakage. Note that the leakage current measurements are published separately for each pin, regardless of if a pin group is provided. Each test evaluation defined in the Test tab of the calling TestStand step must specify a pin. To perform the leakage test on some DUT pins in parallel but not others, use the serialOperationEnabled Boolean input parameter and define separate pin groups (i.e. LeakageOddPins and LeakageEvenPins).

public static void LeakageTest(ISemiconductorModuleContext tsmContext, string[] pinsOrPinGroups, double voltageLevel, double currentLimit, double apertureTime, double settlingTime, bool serialOperationEnabled = false)

Parameters

tsmContext ISemiconductorModuleContext

The NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.ISemiconductorModuleContext object.

pinsOrPinGroups string[]

The pins or pin groups.

voltageLevel double

The DC voltage level to force, in Volts.

currentLimit double

The current limit in Amperes.

apertureTime double

The measurement aperture time in seconds.

settlingTime double

The amount of time to wait before measuring the current, in seconds.

serialOperationEnabled bool

Whether to enforce testing sequentially across pins or pin groups.