Method ContinuityTest

Namespace

NationalInstruments.SemiconductorTestLibrary.TestStandSteps

Assembly

NationalInstruments.SemiconductorTestLibrary.TestStandSteps.dll

ContinuityTest(ISemiconductorModuleContext, string[], double[], string[], double[], double[], double[], double, double)

Performs a basic continuity test. It serially checks either upper or lower protection diodes DUT pins, regardless of if they are mapped to digital or SMU instruments. The test will first set 0V on all the pins and then source a small amount of current on the targeted continuity pins to validate the voltage drop across the protection diode. After current is applied, the targeted pin(s) will be forced back to 0V before continuing on to the next pin. Note that each continuity pin will be tested one pin at a time. Pins mapped to either an NI SMU or NI PPMU(s) instrument channel are supported.

public static void ContinuityTest(ISemiconductorModuleContext tsmContext, string[] supplyPinsOrPinGroups, double[] currentLimitsPerSupplyPinOrPinGroup, string[] continuityPinsOrPinGroups, double[] currentLevelPerContinuityPinOrPinGroup, double[] voltageLimitHighPerContinuityPinOrPinGroup, double[] voltageLimitLowPerContinuityPinOrPinGroup, double apertureTime, double settlingTime)

Parameters

tsmContext ISemiconductorModuleContext

The NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.ISemiconductorModuleContext object.

supplyPinsOrPinGroups string[]

The supply pins or pin groups.

currentLimitsPerSupplyPinOrPinGroup double[]

The current limits for every supply pin or pin group, in amperes.

continuityPinsOrPinGroups string[]

The continuity pins or pin groups.

currentLevelPerContinuityPinOrPinGroup double[]

The current levels for every continuity pin or pin group, in amperes.

voltageLimitHighPerContinuityPinOrPinGroup double[]

The voltage limit high for every continuity pin or pin group, in volts.

voltageLimitLowPerContinuityPinOrPinGroup double[]

The voltage limit low for every continuity pin or pin group, in volts.

apertureTime double

The measurement aperture time in seconds.

settlingTime double

The amount of time to wait before measuring the voltage, in seconds.